Get in Touch

About Us | Providing intelligence to IP Globally

About Us

Patent Search and Analytics support Services

TT Consultants is an ISO 27001 and ISO 9001:2008 certified firm, providing high quality Intellectual Property and Innovation support services. We deliver foremost patent prosecution and litigation searches, patent licensing and infringement analysis, portfolio ranking and competitor benchmarking, R&D search support activities. We offer innovative and automated solutions, through a variety of in-house developed IP tools that help companies to increase their efficiency and reduce costs involved in patent prosecution and litigation matters.

We have a global presence through 5 offices worldwide in India, USA and Taiwan, and have demonstrated our expertise to clients in more than 30 major geographies.

Our expertise across varied technology domains help us understand the key challenges faced by our clients enabling them to maximize their businesses potential. Our strength lies in the exceptionally talented and experienced professionals who work 24×7, ensuring quality outputs and quick turnarounds.

We also provide other professional services like Document Review, Legal Research, Deposition Summarization and more.

Our firm has been recognized with some prestigious awards like the ‘Best Product of the Year -2013′ by STPI, CNBC ICICI SME of the year 2011, STPI Woman Entrepreneur of the Year – 2010, LPO top 20 Vendors etc. Click here to see all the awards recieved by us.

1701 Pennsylvania Avenue, Suite 300, NW, USA
Washington DC. 20006
TT Consultants are Patent Search and Analytics Support Service Providers, certified by ISO 27001 and ISO 9001:2008 based in India, USA and Taiwan. The organization offers high quality Intellectual Property and Innovation Support services including foremost patent prosecution and litigation searches, patent licensing and infringement analysis, portfolio ranking and competitor benchmarking, R&D search support activities.
Landline: +1.202.370.6471
projects@ttconsultants.com
ƒ